Afm most popular related programs listed listed on SoftsLand.com


CrossFont 4.1
CrossFont for Windows can convert TrueType and PostScript Type1 fonts between Macintosh and PC platforms and convert Type 1 to OpenType. Features include automatic file recognition, drag and drop, folder searching, font outlines and hinting are preserved, OS X dfont support, NT SFM support. CrossFont runs under Windows 95,98,ME,NT,2000 and XP.
crossfont, mac, font, fonts, convert, converter, opentype, postscript, macintosh, type1,
CrossFont
Typograf font manager Typograf font manager 4.8f
Top class font manager for OpenType, TrueType, PostScript Type 1 and printer fonts. Previews all fonts. Displays all font properties (typeface classification, kerning pairs, file data, copyright...). Views character set, keyboard layout, zoom view. Finds similar fonts and compares several fonts. Prints fonts in many ways. Manages fonts in database and font groups. Font file management functions. Information about typefaces and typography.
type, font, typeface, typography, truetype, type1, type 1, postscript, load, activate,
n-Surf 1.05
n-Surf is a new generation of software for analyzing and processing of images of surfaces obtained by Scanning Probe or Atomic Force Microscopes (SPM/AFMs). This application was developed for high-quality visualization and easy processing of all types of images. To date, support for Veeco/DI (NanoScope III, NanoScope IV), NT-MDT (.mdt) and MPRI (NANOTOP-205) files has been implemented.
n-surf image processor, n-surf, free, software, nanotechnology, nano technology, spm, scanning probe microscope, afm, atomic force microscope,
Callisto Callisto 1.0.0.1
"Callisto" is freely distributed program for analyzing and processing of data obtained by atomic-force microscopes.The program is based on effective algorithms of correction of specific image distortions."Callisto" allows to work with the data recorded in .spm format. Support of Veeco/DI (NanoScope III, NanoScope IV) and NT-MDT file types. The opportunities of the program are constantly increased.
afm, atomic force, microscope, analysis, alignment, image processing, callisto, data, filtering, fourier,

 

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